半导体学报2000，Vol.21Issue(11)：1060-1063,4.
New Method for Determining Characteristic Parameters of Normal Distribution
New Method for Determining Characteristic Parameters of Normal Distribution
穆甫臣 1谭长华 1许铭真1
作者信息
- 1. Institute of Microelectronics, Peking University, Beijing 100871, China
- 折叠
摘要
Abstract
By proportional differentiating cumulative distribution function of normal distribution,the spectroscopy characteristics are found. The characteristic parameters can be extracted directly from the height and position of the spectroscopy peaks. On this basis ,a new method for determining these parameters of normal distribution is developed. This method can be applied to microelectronics reliability study.关键词
normal distribution/PDO/proportional difference estimate/reliabilityKey words
normal distribution/PDO/proportional difference estimate/reliability分类
信息技术与安全科学引用本文复制引用
穆甫臣,谭长华,许铭真..New Method for Determining Characteristic Parameters of Normal Distribution[J].半导体学报,2000,21(11):1060-1063,4.
