红外与毫米波学报2001，Vol.20Issue(2)：133-135,3.
红外光学薄膜监控系统初始化参数自检算法设计
INITIALIZATION PARAMETER AUTO-CHECK ALGORITHM EXECUTION OF INFRARED THIN FILM MONITORING SYSTEM
摘要
Abstract
Initialization parameters used in infrared optical thin film monitoring system, including input coatings, monitoring mode, monitoring wavelength, material coefficients, slice options,etc.,were listed in forms of dialog control. When the user inputs these parameters, the application programme can automatically check these parameters' validity to ensure that the contents the user inputs are correct, thus, it supplies a kind of security mechanism for subsequent automatic control of optical thin film process. The corresponding algorithm was also given in this paper.关键词
光学薄膜监控/初始化参数/算法设计分类
信息技术与安全科学引用本文复制引用
胡民锋,朱福荣,张凤山..红外光学薄膜监控系统初始化参数自检算法设计[J].红外与毫米波学报,2001,20(2):133-135,3.
