中国电子科技2008，Vol.6Issue(2)：198-204,7.
LabVIEW and PCI DAQ Card Based HTS Test and Control Platforms
LabVIEW and PCI DAQ Card Based HTS Test and Control Platforms
Hui-Bin Zhao 1Jian-Xun Jin 1Pu-Chun Jiang 1Wen-Hui Gao 1Zi-Lu Liang1
作者信息
- 1. Center of Applied Superconductivity and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China
- 折叠
摘要
Abstract
This paper introduces the relevant parameters and related characteristics of the LabVIEW and PCI6221 data acquisition (DAQ) card, describes in detail the approach of building the measure and control platform of virtual instrument (VI) using LabVIEW and PCI6221, specifically discusses the system's application in high temperature superconductor (HTS) research including the test of HTS volt-ampere characteristics and the HTS magnetic energy storage. The experiments prove that the VI test and control system is easy to build and convenient to use.关键词
Data acquisition (DAQ)/high temperature superconductor (HTS)/HTS device/HTS I-V measurement/virtual instrument (VI)Key words
Data acquisition (DAQ)/high temperature superconductor (HTS)/HTS device/HTS I-V measurement/virtual instrument (VI)分类
信息技术与安全科学引用本文复制引用
Hui-Bin Zhao,Jian-Xun Jin,Pu-Chun Jiang,Wen-Hui Gao,Zi-Lu Liang..LabVIEW and PCI DAQ Card Based HTS Test and Control Platforms[J].中国电子科技,2008,6(2):198-204,7.
