中国电子科技2008，Vol.6Issue(2)：212-215,4.
Design of TE01δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film
Design of TE01δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film
摘要
Abstract
A new TE01δ test probe with proper transmission factor is fabricated for the measurement of surface resistance of high temperature superconductor (HTS) thin film. Coupling holes instead of coupling loops are used in the probe for its easier machining and relatively low loss. Two 6 mm × 3 mm × 8 mm dielectric waveguides, one side of them is coated by silver, are used for coupling. The measurement result of S21 agrees well with the simulation because the size of the probe can be rigidly controlled by machine. The microwave surface resistance of four YBCO/MgO films are measured at 77 K and 12 GHz and scaled to 10 GHz according to the f 2 rule. The average surface resistance of four HTS thin films is 0.38 mΩ, the standard deviation and relative standard deviation of one single HTS thin film are 0.009 mΩ and 2.4%, respectively.关键词
High temperature superconductor/surface resistance/surface resistance measurementKey words
High temperature superconductor/surface resistance/surface resistance measurement分类
信息技术与安全科学引用本文复制引用
Cheng Zeng,Zheng-Xiang Luo,Qi-Shao Zhang,Kai Yang..Design of TE01δ Test Probe for Measuring the Microwave Surface Resistance of HTS Thin Film[J].中国电子科技,2008,6(2):212-215,4.基金项目
This work was supported by the National 863 Foundation of China under Grant No. TC265-C304. （）
