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Development of a Drop Tester for Portable Electronic Products

国际设备工程与管理(英文版)2006,Vol.11Issue(4):213-220,8.
国际设备工程与管理(英文版)2006,Vol.11Issue(4):213-220,8.

Development of a Drop Tester for Portable Electronic Products

Development of a Drop Tester for Portable Electronic Products

1

作者信息

  • 1. Institute of Microsystems, Huazhong University of Science and Technology, Wuhan 430074, P. R. China;The School of Mechanical Engineering, East China Jiaotong University, Nanchang 330013, P. R. China;Institute of Microsystems, Huazhong University of Science and Technology, Wuhan 430074, P. R. China;Institute of Microsystems, Huazhong University of Science and Technology, Wuhan 430074, P. R. China;Mechanical Engineering Department, Wayne State University,Detroit,USA;Institute of Microsystems, Huazhong University of Science and Technology, Wuhan 430074, P. R. China;Institute of Microsystems, Huazhong University of Science and Technology, Wuhan 430074, P. R. China
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摘要

Abstract

Portable electronic products are susceptible to accidental drop impact which can cause various functional and physical damage. This paper first presents a patent pending drop tester which allows portable electronic products free drop at any orientation and drop height, and then introduces the drop tester experiment setup and its design principle. Using a cellular phone as an experiment object, we obtain some data such as the impact forces, the impact accelerations, and the strain of an interested spot. By analyzing experiment data the influence of impact to products in various states is investigated with the aim to provide help for the design of products and improvement of reliability.

关键词

drop tester/portable electronic product/reliability

Key words

drop tester/portable electronic product/reliability

引用本文复制引用

..Development of a Drop Tester for Portable Electronic Products[J].国际设备工程与管理(英文版),2006,11(4):213-220,8.

基金项目

This paper is supported by the 863 Project in China under Contract No. 2002AA404430. ()

国际设备工程与管理(英文版)

1007-4546

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