哈尔滨工业大学学报（英文版）2004，Vol.11Issue(2)：223-227,5.
Carbon nanotubes as tips for atomic force microscopy
Carbon nanotubes as tips for atomic force microscopy
摘要
Abstract
Ordinary AFM probes' characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young' s modulus, unique chemical structure, and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes, and are then used for doing AFM experiments. These experiments indicated that carbon nanotube probes have higher elastic deformation, higher resolution and higher durability. And it was also found that carbon nanotube probes can accurately reflect the morphology of deep narrow gaps, while ordinary probes can not reflect.关键词
carbon nanotube/atomic force microscope (AFM)/probeKey words
carbon nanotube/atomic force microscope (AFM)/probe分类
数理科学引用本文复制引用
国立秋,徐宗伟,赵铁强,赵清亮,张飞虎,董申..Carbon nanotubes as tips for atomic force microscopy[J].哈尔滨工业大学学报（英文版）,2004,11(2):223-227,5.基金项目
Sponsored by the National Natural Science Foundation of China (Grant No. 50202006) and the Mulidisciline Scientific Research Foundation of Harbin Institute of Technology (Grant No. HIT. MD. 2001.04). （Grant No. 50202006）
