首页|期刊导航|半导体学报|Raman scattering studies on PZT thin films for trigonal-tetragonal phase transition

Raman scattering studies on PZT thin films for trigonal-tetragonal phase transition

Liang Ting Li Junhong Du Wenlong Xue Chenyang Zhang Wendong

半导体学报2009，Vol.30Issue(8)：28-30,3.

半导体学报2009，Vol.30Issue(8)：28-30,3.DOI:10.1088/1674-4926/30/8/083001

Raman scattering studies on PZT thin films for trigonal-tetragonal phase transition

Liang Ting ¹Li Junhong ¹Du Wenlong ¹Xue Chenyang ¹Zhang Wendong¹

作者信息

1. Key Laboratory of Instrumentation Science & Dynamic Measurement of the Chinese Ministry of Education,North University of China,Taiyuan 030051,China
折叠

摘要

Abstract

O)T mode were enhanced with the increase of the annealing tem-perature. So, the conclusions were obtained that the trigonal phase turned into a tetragonal phase as temperature increased.

关键词

PZT/Raman scattering/phase transition

Key words

PZT/Raman scattering/phase transition

分类

信息技术与安全科学

引用本文复制引用

Liang Ting,Li Junhong,Du Wenlong,Xue Chenyang,Zhang Wendong..Raman scattering studies on PZT thin films for trigonal-tetragonal phase transition[J].半导体学报,2009,30(8):28-30,3.

基金项目

Project supported by the National High Technology Research and Development Program of China (No. 2006AA040601). （No. 2006AA040601）

半导体学报

OA北大核心CSCDCSTPCDEI

ISSN：1674-4926

访问量0

下载量0

段落导航