Raman scattering studies on PZT thin films for trigonal-tetragonal phase transitionOA北大核心CSCDCSTPCD
Raman scattering studies on PZT thin films for trigonal-tetragonal phase transition
O)T mode were enhanced with the increase of the annealing tem-perature. So, the conclusions were obtained that the trigonal phase turned into a tetragonal phase as temperature increased.
O)T mode were enhanced with the increase of the annealing tem-perature. So, the conclusions were obtained that the trigonal phase turned into a tetragonal phase as temperature increased.
Liang Ting;Li Junhong;Du Wenlong;Xue Chenyang;Zhang Wendong
Key Laboratory of Instrumentation Science & Dynamic Measurement of the Chinese Ministry of Education,North University of China,Taiyuan 030051,ChinaKey Laboratory of Instrumentation Science & Dynamic Measurement of the Chinese Ministry of Education,North University of China,Taiyuan 030051,ChinaKey Laboratory of Instrumentation Science & Dynamic Measurement of the Chinese Ministry of Education,North University of China,Taiyuan 030051,ChinaKey Laboratory of Instrumentation Science & Dynamic Measurement of the Chinese Ministry of Education,North University of China,Taiyuan 030051,ChinaKey Laboratory of Instrumentation Science & Dynamic Measurement of the Chinese Ministry of Education,North University of China,Taiyuan 030051,China
电子信息工程
PZTRaman scatteringphase transition
PZTRaman scatteringphase transition
《半导体学报》 2009 (8)
28-30,3
Project supported by the National High Technology Research and Development Program of China (No. 2006AA040601).
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