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A surface potential-based non-charge-sheet core model for undoped surrounding-gate MOSFETs

何进 张健 张立宁 马晨月 陈文新

半导体学报2009,Vol.30Issue(2):30-33,4.
半导体学报2009,Vol.30Issue(2):30-33,4.DOI:10.1088/1674-4926/30/2/024001

A surface potential-based non-charge-sheet core model for undoped surrounding-gate MOSFETs

A surface potential-based non-charge-sheet core model for undoped surrounding-gate MOSFETs

何进 1张健 2张立宁 3马晨月 2陈文新2

作者信息

  • 1. The Key Laboratory of Integrated Microsystems, Peking University Shenzhen Graduate School,Shenzhen 518055, China
  • 2. TSRC and ULTRAS Team, EECS, Peking University, Beijing 100871, China
  • 3. Department of Electronics and Computer Engineering, Hong Kong University of Science & Technology, Hong Kong, China
  • 折叠

摘要

Abstract

A surface potential based non-charge-sheet core model for cylindrical undoped surrounding-gate (SRG) MOSFETs is presented. It is based on the exact surface potential solution of Poisson's equation and Pao-Sah's dual integral without the charge-sheet approximation, allowing the SRG-MOSFET characteristics to be adequately described by a single set of the analytic drain current equation in terms of the surface potential evaluated at the source and drain ends. It is valid for all operation regions and traces the transition from the linear to saturation and from the sub-threshold to strong inversion region without fiRing-parameters, and verified by the 3-D numerical simulation.

关键词

non-classical MOS transistor/ surrounding-gate MOSFETs/ device physics/ surface potential model/ non-charge-sheet approximation

Key words

non-classical MOS transistor/ surrounding-gate MOSFETs/ device physics/ surface potential model/ non-charge-sheet approximation

分类

信息技术与安全科学

引用本文复制引用

何进,张健,张立宁,马晨月,陈文新..A surface potential-based non-charge-sheet core model for undoped surrounding-gate MOSFETs[J].半导体学报,2009,30(2):30-33,4.

基金项目

Project supported by the National Natural Science Foundation of China (No. 60876027), a Competitive Earmarked Grant from the Research Grant Council of Hong Kong SAR (No. HKUST6289/04E), and the International Joint Research Program from Japan (No. NEDOO5/06.EG01). (No. 60876027)

半导体学报

OA北大核心CSCDCSTPCDEI

1674-4926

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