首页|期刊导航|东华大学学报（英文版）|The Recognition of Silk Fabric Defects Based on Biorthogonal Wavelet Analysis and SOM Neural Network
东华大学学报（英文版）2007，Vol.24Issue(3)：313-316,325,5.
The Recognition of Silk Fabric Defects Based on Biorthogonal Wavelet Analysis and SOM Neural Network
The Recognition of Silk Fabric Defects Based on Biorthogonal Wavelet Analysis and SOM Neural Network
摘要
Abstract
A feasible approach fog the recognition of silk fabric defects based on wavelet transform and SOM neural network is proposed in this paper, the indispensable processes of which are defect images denoising and enhancement, image edge detection, feature extraction and defects identification. Both geometrical and textural feature panuneters are extracted from the edge image and the enhanced defect image, and utifize SOM neural network to recognize the common defects which silk fabrics have, including warp- lacking, weft-lacking, double weft, loom bars, oll-stalin. Experimental results show the advantages with high identification correctness and high inspection speed.关键词
silk fabrics/ defect recognition/ waveletanalysis ! neural networkKey words
silk fabrics/ defect recognition/ waveletanalysis ! neural network分类
信息技术与安全科学引用本文复制引用
LIU Jian-li,ZUO Bao-qi..The Recognition of Silk Fabric Defects Based on Biorthogonal Wavelet Analysis and SOM Neural Network[J].东华大学学报（英文版）,2007,24(3):313-316,325,5.基金项目
Ministry of Commerce of the People's Republic of China (PRC) （PRC）
