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热效应致RLC互连延时变化研究

董刚 徐如清 杨银堂

电子器件2009,Vol.32Issue(2):357-360,4.
电子器件2009,Vol.32Issue(2):357-360,4.

热效应致RLC互连延时变化研究

Research on RLC Interconnect Delay Variation Induced by Thermal Effects

董刚 1徐如清 1杨银堂1

作者信息

  • 1. 西安电子科技大学微电子所宽禁带半导体材料与器件教育部重点实验室,西安,710071
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摘要

Abstract

Analysis of RIC interconnect delay increase induced by thermal effects is presented.A tempera-ture-dependent RLC interconnect delay model is proposed.The model is applied to quantify the impact of thermal effects on interconnect delay.Results show that for each 20℃increase in temperature there is roughly a 5 tO 6 percent increase in the delay for the RLC interconnect.

关键词

RLC互连/延时/热效应/增加

Key words

RIC interconnect/delay/thermal effects/increase

分类

信息技术与安全科学

引用本文复制引用

董刚,徐如清,杨银堂..热效应致RLC互连延时变化研究[J].电子器件,2009,32(2):357-360,4.

基金项目

Proiect supported by the National Natural Science Foundation of China(60606006) (60606006)

电子器件

OACSTPCD

1005-9490

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