四川大学学报（自然科学版）2000，Vol.37Issue(3)：384-388,5.
微波测量中的去嵌入方法
DE-EMBEDDING METHODS IN MICROWAVE MEASUREMENT
廖进昆 1李珊君 1吴志红1
作者信息
- 1. 四川大学电气信息学院通信工程系，成都610065
- 折叠
摘要
Abstract
The problem of measurements for power microstrip microwave devices is considered, and the LRL(Line-Reflect-Line) method is used to de-embed the S parameters from the microwave transistor test fixture.The S parameters of the devices under test are expressed as the single-valued functions of the measured parameters, and the errors caused by the phase uncertainties of embedded network parameters are deleted.关键词
微波测量/去嵌入/测试夹具/散射参量Key words
microwave measurement/de-embedding/test fixture/scattering parameters分类
信息技术与安全科学引用本文复制引用
廖进昆,李珊君,吴志红..微波测量中的去嵌入方法[J].四川大学学报（自然科学版）,2000,37(3):384-388,5.
