A novel electrical measurement method of peak junction temperature based on the excessive thermotaxis effect of low currentOA北大核心CSCDCSTPCD
A novel electrical measurement method of peak junction temperature based on the excessive thermotaxis effect of low current
niform property of junction temperature distribution are analyzed successfully.
niform property of junction temperature distribution are analyzed successfully.
Zhu Yangjun;Miao Qinghai;Zhang Xinghua;Han Zhengsheng
Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, ChinaSchool of Physics, Shandong University, Jinan 250100, ChinaSchool of Physics, Shandong University, Jinan 250100, ChinaInstitute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
电子信息工程
peak junction temperaturemulti-step currentexcessive thermotaxis effect of low currentpower transistor
peak junction temperaturemulti-step currentexcessive thermotaxis effect of low currentpower transistor
《半导体学报》 2009 (9)
晶体管热谱学的基础研究
41-44,4
Project supported by the National Natural Science Foundation of China (No. 60476039) and the Director Foundation of Institute of Microelectronics of Chinese Academy of Sciences (No. 5408SA011001).
评论