电子器件2002，Vol.25Issue(4)：444-447,4.
内建自测试中移位器的设计及其应用
Design and Applications of Phase Shifters in BIST
毛武晋 1王澍 1杨军 1许舸夫1
作者信息
- 1. 东南大学国家集成电路系统工程中心,南京市,210096
- 折叠
摘要
Abstract
This paper presents new design and synthesis techniques that remove effects of linear dependencies of subsequences generated by linear feedback shift registers (LFSR) driving parallel scan chains. As shown in the paper, it is possible to synthesize very large and fast phase shifters for BIST applications with guaranteed phaseshifts between scan chains and very small number of gates per channel.关键词
内建自测试/移位器/转置线形反馈移位寄存器Key words
built-in self test/phase shifter/dual LFSR分类
信息技术与安全科学引用本文复制引用
毛武晋,王澍,杨军,许舸夫..内建自测试中移位器的设计及其应用[J].电子器件,2002,25(4):444-447,4.
