材料工程Issue(4):44-47,4.
SiCw/Al复合材料基体屈服强度的X射线测量
Determination for the Yield Strength of Matrix in a SiCw/Al Composite by the X-ray Diffraction
姜传海 1吴建生 1王德尊2
作者信息
- 1. 上海交通大学国家
- 2. 哈尔滨工业大学材料科学与工程学院,
- 折叠
摘要
Abstract
According to the principle of stress measurement by X-ray diffraction, the test method of matrix yield strength in composites was established. The actual yield strength of matrix in a 20vol%SiCw/Al composite was measured. The results show that, the matrix yield strength in the composite is obviously higher than that of single matrix material. The matrix strengthening in the composite is mainly due to high dislocation density and fine sub-gain.关键词
SiCw/Al/基体强度/X射线衍射分类
通用工业技术引用本文复制引用
姜传海,吴建生,王德尊..SiCw/Al复合材料基体屈服强度的X射线测量[J].材料工程,2001,(4):44-47,4.