东华大学学报（英文版）2005，Vol.22Issue(3)：44-50,7.
Compact-Parity Testing and Testable Design
Compact-Parity Testing and Testable Design
摘要
Abstract
Parity testing is one of the compact testing techniques,which, traditionally, relies on applying all 2n input combinations to an n-input combinational circuit without need of knowing the implementation of the circuits under test. The faults can be detected just by observing and comparing its parity of whole output of circuit with the expectation one. The way seemed to be less interesting to the test engineers in the past days, mainly due to the reasons of its exhaustive testing and time-consuming, which became a barrier as the number of input lines gets growing. However its great facility and convenience in testing still interest to the engineers who need to have a quick look at the qualities of the circuits without generating the test patterns for a given circuit to be tested. In this paper, a new approach called pseudo-parity testing is presented to deal with the dilemma we are facing: i. e. to change an exhaustive parity testing into a non-exhaustive one, followed by a pseudoparity testable design to help realize the new way of pseudoparity testing. The idea of pseudo-parity testing presented in this paper may resume its spirits towards its promising future.关键词
parity/parity testing/pseudo-parity testing/parity testable designKey words
parity/parity testing/pseudo-parity testing/parity testable design分类
建筑与水利引用本文复制引用
XU Shi-yi..Compact-Parity Testing and Testable Design[J].东华大学学报（英文版）,2005,22(3):44-50,7.基金项目
This work was supported by National Natural Science Foundation of China under the grant No.60173029 and 60473033 （）
