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0.1μm T型栅PHEMT器件

郑英奎 刘明 和致经 吴德馨

半导体学报2001,Vol.22Issue(4):476-480,5.
半导体学报2001,Vol.22Issue(4):476-480,5.

0.1μm T型栅PHEMT器件

0.1μm T-Shaped Gate PHEMT Device

郑英奎 1刘明 1和致经 1吴德馨1

作者信息

  • 1. 中国科学院微电子中心,
  • 折叠

摘要

Abstract

PHEMT devices with T-shaped gate have been developed by using the mixed lithography—a new method combining the Electron Beam Lithography(EBL) with the normal contact lithography.The multilayer resist technique and different development are used to obtain a T-shaped gate structure.The fabrication technique and the device characteristics of the 0.1μm gate-length PHEMT have been studied,with good performance of PHEMT,690mS/mm gm and 93.97GHz ft achieved.

关键词

二维电子气/电子束光刻/混合曝光/PHEMT/T型栅

分类

信息技术与安全科学

引用本文复制引用

郑英奎,刘明,和致经,吴德馨..0.1μm T型栅PHEMT器件[J].半导体学报,2001,22(4):476-480,5.

半导体学报

OA北大核心CSCD

1674-4926

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