东华大学学报（英文版）2007，Vol.24Issue(4)：484-487,493,5.
Modeling of DSBs Generation and Repair Process under Ion Radiation
Modeling of DSBs Generation and Repair Process under Ion Radiation
摘要
Abstract
Under acute perturbations from outside, cell can trigger the self-defense mechanisms in fighting against these genome stresses. To simulate the investigation of the complicated mechanisms of cellular responding DNA damage at single cell level, a model of the double strand breaks (DSBs) generation and repair process is proposed under continuous effect of acute IR. Under different IR dose domains, this model can be used to simulate the complicated interactions among vital components within the cell, and the plausible outcomes of cellular response in fighting against DNA damage.关键词
P53/ DNA damage/ IR/ Repair Protein/ModelingKey words
P53/ DNA damage/ IR/ Repair Protein/Modeling分类
信息技术与安全科学引用本文复制引用
QI Jin-peng,SHAO Shi-huang,XIE Jin-li,BAI Hui..Modeling of DSBs Generation and Repair Process under Ion Radiation[J].东华大学学报（英文版）,2007,24(4):484-487,493,5.基金项目
Foundation items: Doctoral Foundation from National Education Committee (20060255006), China, National Natural Science Foundation of China (60661003), and the Doctoral Innovation Foundation from Donghua University (10406001900604), China. （20060255006）
