半导体学报2007，Vol.28Issue(z1)：58-61,4.
微波功率器件的滤波器测试电路
A Test Circuit with Microstrip Filter for Microwave Power Device
罗卫军 1陈晓娟 2刘果果 2刘新宇 2王晓燕 2方测宝 1郭伦春 1王晓亮1
作者信息
- 1. 中国科学院半导体研究所,北京,100083
- 2. 中国科学院微电子研究所,北京,100029
- 折叠
摘要
Abstract
With the principles of microwave circuits and semiconductor device physics, three kinds of microwave power device test circuits are designed and simulated, whose properties are evaluated by a parameter network analyzer within the frequency range from 3 to 8GHz. The simulated results verify that the test circuit with stepped-impedance filter bias network has a larger bandwidth than that with the radial stub. A microstrip interdigital capacitor is used in the third test circuit to replace the DC block,however,which does not show its advantage during the test frequency band. Based on the simulated results, the stepped-impedance filter test circuit can be used to evaluate microwave power devices in the whole C band,namely from 4 to 8GHz.关键词
滤波器/扇形线/测试电路/阶梯阻抗/叉指耦合电容Key words
filteri radial stub/test circuit/stepped-impedance/interdigital couple capacitor分类
电子信息工程引用本文复制引用
罗卫军,陈晓娟,刘果果,刘新宇,王晓燕,方测宝,郭伦春,王晓亮..微波功率器件的滤波器测试电路[J].半导体学报,2007,28(z1):58-61,4.
