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0.5μm SOI CMOS器件和电路

刘新宇 孙海峰 海朝和 吴德馨

半导体学报2001,Vol.22Issue(5):660-663,4.
半导体学报2001,Vol.22Issue(5):660-663,4.

0.5μm SOI CMOS器件和电路

0.5μm Partially Depleted CMOS/SOI Device and Circuit

刘新宇 1孙海峰 1海朝和 1吴德馨1

作者信息

  • 1. 中国科学院微电子中心,
  • 折叠

摘要

Abstract

The partially depleted CMOS/SOI device and circuit with channel length of 0.5μm have been studied,and the Complete 0.5μm CMOS/SOI technology been developed as well.Well-behaved devices and circuits are obtained,with the per-stage propagation delay of 101-stage 0.5μm CMOS/SOI ring oscillator being 42ps under 3V supply voltage.Some characteristics of the partially depleted CMOS/SOI device are also discussed,such as “float-body” effect,“kink” effect,and anomalous subthreshold characteristics,etc.

关键词

部分耗尽/“浮体”效应/反常亚阈值特性

分类

信息技术与安全科学

引用本文复制引用

刘新宇,孙海峰,海朝和,吴德馨..0.5μm SOI CMOS器件和电路[J].半导体学报,2001,22(5):660-663,4.

半导体学报

OA北大核心CSCD

1674-4926

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