哈尔滨工业大学学报（英文版）2008，Vol.15Issue(5)：690-693,4.
An improved fabrication method for carbon nanotube probe
An improved fabrication method for carbon nanotube probe
摘要
Abstract
An improved arc discharge method is developed to fabricate the carbon nanotube probe.In this method,the silicon probe and the carbon nanotube were manipulated under an optical microscope.When the silicon probe and the carbon nanotube were very close,30-60 V dc or ac was applied between them,and the carbon nanotube was divided and attached to the end of the silicon probe.Comparing with the arc discharge method,the new method need not coat the silicon probe with metal in advance,which Can greatly reduce the fabrication difficulty and cost.The fabricated carbon nanotube probe exhibits the good property of hish aspect ratio and can reflect the true topography more accurately than the silicon probe.关键词
carbon nanotube(CNT)/atomic force microscope(AFM)/probe/fabricationKey words
carbon nanotube(CNT)/atomic force microscope(AFM)/probe/fabrication分类
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XU Zong-wei,GUO Li-qiu,DONG Shen,ZHAO Qing-liang..An improved fabrication method for carbon nanotube probe[J].哈尔滨工业大学学报（英文版）,2008,15(5):690-693,4.基金项目
Sponsored by the National Natural Science Foundation of China(Grant No.50205006). （Grant No.50205006）
