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首页|期刊导航|半导体学报|Small-signal model parameter extraction for microwave SiGe HBTs based on Y- and Z-parameter characterization

Small-signal model parameter extraction for microwave SiGe HBTs based on Y- and Z-parameter characterization

Fu Jun

半导体学报2009,Vol.30Issue(8):71-77,7.
半导体学报2009,Vol.30Issue(8):71-77,7.DOI:10.1088/1674-4926/30/8/084005

Small-signal model parameter extraction for microwave SiGe HBTs based on Y- and Z-parameter characterization

Small-signal model parameter extraction for microwave SiGe HBTs based on Y- and Z-parameter characterization

Fu Jun1

作者信息

  • 1. Tsinghua National Laboratory for Information Science and Technology TNList,Institute of Microelectronics,Tsinghua University,Beijing 100084,China
  • 折叠

摘要

Abstract

ter extraction method is further validated by comparing the modeled and simulated S-parameters as a function of frequency.

关键词

SiGe/heterojunction bipolar transistors/small-signal/model/parameter extraction

Key words

SiGe/heterojunction bipolar transistors/small-signal/model/parameter extraction

分类

信息技术与安全科学

引用本文复制引用

Fu Jun..Small-signal model parameter extraction for microwave SiGe HBTs based on Y- and Z-parameter characterization[J].半导体学报,2009,30(8):71-77,7.

半导体学报

OA北大核心CSCDCSTPCDEI

1674-4926

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