首页|期刊导航|中国农业科学（英文版）|Advances in Localization and Molecular Markers of Wheat Leaf Rust Resistance Genes
中国农业科学（英文版）2004，Vol.3Issue(10)：770-779,10.
Advances in Localization and Molecular Markers of Wheat Leaf Rust Resistance Genes
Advances in Localization and Molecular Markers of Wheat Leaf Rust Resistance Genes
摘要
Abstract
Genetic resistance is the most economical method of reducing yield losses caused by wheat leaf rust. To identify the leaf rust resistance genes in commonly used parental germplasm and released cultivars become very important for utilizing the genetic resistance tc wheat leaf rust fully. Up to date, about 90 leaf rust resistance genes have been found,of which 51 genes have been located and mapped to special chromosomes, and 56 genes have been designated officially according to the standards set forth in the Catalogue of Gene Symbols for wheat. Twenty-four wheat leaf rust resistance genes have been developed for their molecular markers. It is very important to isolate, characterize, and map leaf rust resistance genes due to the resistance losses of the genes caused by the pathogen continuously.关键词
Wheat leaf rust/Resistance gene/Chromosomal localization/Molecular markerKey words
Wheat leaf rust/Resistance gene/Chromosomal localization/Molecular marker引用本文复制引用
YANG Wen-xiang,LIU Da-qun..Advances in Localization and Molecular Markers of Wheat Leaf Rust Resistance Genes[J].中国农业科学（英文版）,2004,3(10):770-779,10.基金项目
This study was supported by the National Natural Science Foundation of China (30170602)and the Biological Control Center of Plant Pathogens and Plant Pests of Hebei Province. （30170602）
