半导体学报2009，Vol.30Issue(5)：86-90,5.DOI:10.1088/1674-4926/30/5/055006
Modeling and analysis of single-event transients in charge pumps
Modeling and analysis of single-event transients in charge pumps
摘要
Abstract
It has been shown that charge pumps (CPs) dominate single-event transient (SET) responses of phaselocked loops (PLLs). Using a pulse to represent a single event hit on CPs, the SET analysis model is established and the characteristics of SET generation and propagation in PLLs are revealed. An analysis of single event transients in PLLs demonstrates that the settling time of the voltage-controlled oscillators (VCOs) control voltage after a single event strike is strongly dependent on the peak control voltage deviation, the SET pulse width, and the settling time constant. And the peak control voltage disturbance decreases with the SET strength or the filter resistance. Furthermore, the analysis in the proposed PLL model is confirmed by simulation results using MATLAB and HSPICE,respectively.关键词
single event transient/charge pump/phase-locked loopKey words
single event transient/charge pump/phase-locked loop分类
信息技术与安全科学引用本文复制引用
Zhao Zhenyu,Li Junfeng,Zhang Minxuan,Li Shaoqing..Modeling and analysis of single-event transients in charge pumps[J].半导体学报,2009,30(5):86-90,5.基金项目
Project supported by the National Natural Science Foundation of China (Nos.60836004, 60676010) and the PhD Program Foundation of the Ministry of Education of China (No.20079998015). （Nos.60836004, 60676010）
