Design and application of a depletion-mode NJFET in a high-voltage BiCMOS processOA北大核心CSCDCSTPCDEI

作者：Liu Yong;Tang Zhaohuan;Wang Zhikuan;Yang Yonghui;Yang Weidong;Hu Yonggui

作者单位：Sichuan Institute of Solid-State Circuits,CETC,Chongqing 400060,ChinaNational Laboratory of Analog ICs,Chongqing 400060,ChinaSichuan Institute of Solid-State Circuits,CETC,Chongqing 400060,ChinaSichuan Institute of Solid-State Circuits,CETC,Chongqing 400060,ChinaSichuan Institute of Solid-State Circuits,CETC,Chongqing 400060,ChinaNational Laboratory of Analog ICs,Chongqing 400060,China

中文关键词：depletion-mode NJFEThigh-voltage BiCMOS processADCDACtemperature coefficient

英文关键词：depletion-mode NJFEThigh-voltage BiCMOS processADCDACtemperature coefficient

刊名：《半导体学报》 2010 (8)

页码/页数：70-73,4

DOI：10.1088/1674-4926/31/8/084006