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A Novel Variable Shifting Code for Test Compression of SoC

Xiao-Le Cui Liang Yin Jin-Xi Hong Ren-Fu Zuo Xiao-Xin Cui Wei Cheng

中国电子科技2009，Vol.7Issue(4)：375-379,5.

A Novel Variable Shifting Code for Test Compression of SoC

Xiao-Le Cui ¹Liang Yin ¹Jin-Xi Hong ¹Ren-Fu Zuo ¹Xiao-Xin Cui ¹Wei Cheng¹

作者信息

1. The Key Lab of Integrated Microsystems, Shenzhen Graduate School of Peking University, Shenzhen, 518055, China
折叠

摘要

关键词

FDR code/run-length code/test data compression/VSPTIDR code

Key words

FDR code/run-length code/test data compression/VSPTIDR code

引用本文复制引用

Xiao-Le Cui,Liang Yin,Jin-Xi Hong,Ren-Fu Zuo,Xiao-Xin Cui,Wei Cheng..A Novel Variable Shifting Code for Test Compression of SoC[J].中国电子科技,2009,7(4):375-379,5.

基金项目

This work was supported by the Shenzhen Government R&D Project under Grant No. JC200903160361A. （）

中国电子科技

ISSN：1674-862X

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