中国电子科技2009，Vol.7Issue(4)：348-352,5.
A Hierarchical Modeling and Fault Diagnosis Method for Complex Electronic Devices
A Hierarchical Modeling and Fault Diagnosis Method for Complex Electronic Devices
摘要
关键词
Bayes inference/complex electronic devices/fault diagnosis/hierarchical modeling/support vector machineKey words
Bayes inference/complex electronic devices/fault diagnosis/hierarchical modeling/support vector machine引用本文复制引用
Bing Long,Shu-Lin Tian,Hou-Jun Wang..A Hierarchical Modeling and Fault Diagnosis Method for Complex Electronic Devices[J].中国电子科技,2009,7(4):348-352,5.基金项目
This work was supported by the Defense Foundation Scientific Research Fund under Grant No. 9140A17030308DZ02,9140A16060409DZ02, and the National Natural Science Fundation of Chinaunder Grant No. 60934002.The authors would like to thank Dr. Lianke for the extensive discussions on the subject and UESTC for its support under Grant No. JX0756, Y02018023601059. （）
