强激光与粒子束2011，Vol.23Issue(1)：221-224,4.DOI:10.3788/HP1PB20112301.0221
负折射率介质测试装置设计与测试
Test device for negative refractive index materials
摘要
Abstract
To investigate the novel characteristics of negative refractive index materials(NRIMs), a test device was designed and fabricated based on the Snell law to measure the refractive characteristics of an X-band (8.2～ 12.4 GHz) NRIM sample consisting of ferrimagnetic materials and wire array.The refractive characteristics of the wedge-shaped paraffin sample and NRIM sample were tested with the device, respectively.The measurements of the paraffin sample demonstrate the validity of the fabricated device.The measurements of the NRIM sample exhibit the material's negative refraction characteristic, which is then proven by the wave beam shift characteristic of the parallel-plate NRIM with electromagnetic simulations.关键词
负折射率介质/亚铁磁材料/金属线阵列/折射特性测试装置/波束位移实验Key words
negative refractive index materials/ ferrimagnetic materials/ wire array/ refraction test device/ wave beam shift experiment分类
信息技术与安全科学引用本文复制引用
黄勇军,文光俊,李天倩,谢康..负折射率介质测试装置设计与测试[J].强激光与粒子束,2011,23(1):221-224,4.基金项目
国家自然科学基金项目(60571024,60771046,60588502) （60571024,60771046,60588502）
