强激光与粒子束2011，Vol.23Issue(1)：272-276,5.DOI:10.3788/HP1PB20112301.0272
金属化膜脉冲电容器的可靠性评估
Reliability assessment of metallized film pulse capacitor
摘要
Abstract
A new reliability estimation algorithm for metallized film pulse capacitor was brought forward based on step-down stress accelerated degradation testing(SDSADT) method. The SDSADT was expounded, and the key procedure in the reliability estimation, i.e. testing data conversion, was fully explained. Then reliability assessment arithmetics based on pseudo failure lifetime and random degradation path were proposed. A numerical example was given to illustrate the algorithm. The results show that, at the same estimation precision, this algorithm can have a testing time 45 ％ shorter than that based on constant stress accelerated degradation method.关键词
可靠性/加速退化试验/金属化膜脉冲电容器/伪失效寿命/随机退化轨迹Key words
reliability/ step-down stress accelerated degradation testing/ metallized film pulse capacitor/ pseudo failure lifetime/ random degradation path分类
通用工业技术引用本文复制引用
贾占强,蔡金燕,梁玉英,韩春辉..金属化膜脉冲电容器的可靠性评估[J].强激光与粒子束,2011,23(1):272-276,5.基金项目
国家自然科学基金项目(60472009) （60472009）
