现代电子技术2011，Vol.34Issue(1)：170-172,3.
电路系统中的闩锁效应及其预防设计
Latch-up Effect and Its Prevention in Circuit Systems Based on CMOS
摘要
Abstract
The latch-up effect which is easy to appear in CMOS IC and the widely used circuit systems with an attributive defect leading to failure of circuits is elaborated.Key factors causing latch-up effect are discussed.Furthermore, the special interface method of critical power-on time-sequence, circuit isolatation design based on photo-electric coupler and hot-plugging modules is proposed.It testified in applications that the designs are helpful to reduce the risk of latch-up effect.关键词
闩锁效应/上电时序/光耦/热插拔分类
信息技术与安全科学引用本文复制引用
吴允平,苏伟达,李汪彪,蔡声镇..电路系统中的闩锁效应及其预防设计[J].现代电子技术,2011,34(1):170-172,3.基金项目
福建省自然科学基金项目(2010J01326) （2010J01326）
福建省科技厅项目(2008 H0022,2009 H0018) （2008 H0022,2009 H0018）
校教师项目(2008100214) （2008100214）
