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Dummy fill effect on CMP planarity

Zhou Junxiong Chen Lan Ruan Wenbiao Li Zhigang Shen Weixiang Ye Tianchun

半导体学报2010,Vol.31Issue(10):135-138,4.
半导体学报2010,Vol.31Issue(10):135-138,4.DOI:10.1088/1674-4926/31/10/106003

Dummy fill effect on CMP planarity

Dummy fill effect on CMP planarity

Zhou Junxiong 1Chen Lan 1Ruan Wenbiao 1Li Zhigang 1Shen Weixiang 1Ye Tianchun1

作者信息

  • 1. Institute of Microelectronics,Chinese Academy of Sciences,Beijing, 100029,China
  • 折叠

摘要

关键词

chemical mechanical polishing/dummy fill/dishing/erosion/planarity

Key words

chemical mechanical polishing/dummy fill/dishing/erosion/planarity

引用本文复制引用

Zhou Junxiong,Chen Lan,Ruan Wenbiao,Li Zhigang,Shen Weixiang,Ye Tianchun..Dummy fill effect on CMP planarity[J].半导体学报,2010,31(10):135-138,4.

基金项目

Project supported by the National Major Science and Technology Special Project of China(No.2008ZX01035-001-08). (No.2008ZX01035-001-08)

半导体学报

OA北大核心CSCDCSTPCDEI

1674-4926

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