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Negative bias temperature instability induced single event transient pulse narrowing and broadening

Chen Jianjun Chen Shuming Liang Bin Liu Biwei

半导体学报2010，Vol.31Issue(12)：38-42,5.

半导体学报2010，Vol.31Issue(12)：38-42,5.DOI:10.1088/1674-4926/31/12/124004

Negative bias temperature instability induced single event transient pulse narrowing and broadening

Chen Jianjun ¹Chen Shuming ¹Liang Bin ¹Liu Biwei¹

作者信息

1. School of Computer Science, National University of Defense Technology, Changsha 410073,China
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摘要

关键词

negative bias temperature instability/single event transient/narrowing and broadening

Key words

negative bias temperature instability/single event transient/narrowing and broadening

引用本文复制引用

Chen Jianjun,Chen Shuming,Liang Bin,Liu Biwei..Negative bias temperature instability induced single event transient pulse narrowing and broadening[J].半导体学报,2010,31(12):38-42,5.

基金项目

Project supported by the Key Program of the National Natural Science Foundation of China(No.60836004)and the National Natural Science Foundation of China (Nos.61006070,61076025). （No.60836004）

半导体学报

OA北大核心CSCDCSTPCDEI

ISSN：1674-4926

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