激光技术2011，Vol.35Issue(2)：272-274,277,4.DOI:10.3969/j.issn.1001-3806.2011.02.035
泽尔尼克多项式拟合波面中采样点数目的研究
Research of sampling point number in wave front fitting with Zernike polynomials
谢苏隆 1钟鹰1
作者信息
- 1. 中国空间技术研究院,西安分院重点实验室,西安,710000
- 折叠
摘要
Abstract
In order to study the effect of sampling point number on fitting precision when fitting wave front by Zernike polynomials, it was analyzed by means of the method of inadequate induction, and then the change law of sampling point number and fitting precision of dozens of different test functions was obtained.The results reveal that all test functions follow the same law that fitting precision has little change when sampling point number reach a certain number.In addition, the change law of sampling point number and Zernike polynomials term number was obtained by calculation.Thus, the experiential formula to determinate sampling point number are found, which is of great practical instructional significance in wave front fitting with Zernike polynomials.关键词
测量与计量/波面拟合/不完全归纳法/泽尔尼克多项式Key words
measurement and metrology/ wave front fitting/ inadequate induction/ Zemike polynomials分类
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谢苏隆,钟鹰..泽尔尼克多项式拟合波面中采样点数目的研究[J].激光技术,2011,35(2):272-274,277,4.
