| 注册
首页|期刊导航|中国电子科技|Selection of Minimal Test Points Set for Integer-Coded Fault Wise Table

Selection of Minimal Test Points Set for Integer-Coded Fault Wise Table

Shu-Lin Tian Cheng-Lin Yang Bing Long

中国电子科技2009,Vol.7Issue(4):312-316,5.
中国电子科技2009,Vol.7Issue(4):312-316,5.

Selection of Minimal Test Points Set for Integer-Coded Fault Wise Table

Selection of Minimal Test Points Set for Integer-Coded Fault Wise Table

Shu-Lin Tian 1Cheng-Lin Yang 1Bing Long1

作者信息

  • 1. School of Automation engineering, University of Electronic Science and Technology of China Chengdu, 610054, China
  • 折叠

摘要

关键词

Fault-pair table/integer-coded fault wise table/optimization/test points selection

Key words

Fault-pair table/integer-coded fault wise table/optimization/test points selection

引用本文复制引用

Shu-Lin Tian,Cheng-Lin Yang,Bing Long..Selection of Minimal Test Points Set for Integer-Coded Fault Wise Table[J].中国电子科技,2009,7(4):312-316,5.

基金项目

This work was partly supported by National Natural Science Foundation of China under Grant No.60934002, and General Armament Department under Grant No. 51317040102. ()

中国电子科技

1674-862X

访问量0
|
下载量0
段落导航相关论文