半导体学报2011，Vol.32Issue(2)：11-14,4.DOI:10.1088/1674-4926/32/2/022003
Structural and optical properties of Cd0.8Zn0.2S thin films*
Structural and optical properties of Cd0.8Zn0.2S thin films*
摘要
Abstract
Cd1-xZnxS thin films were deposited on glass substrates by a vacuum coevaporation method. The structural, compositional, and optical properties of as-deposited Cd0.8Zn0.2S films were investigated using X-ray diffraction (XRD), X-ray fluorescence (XRF), X-ray photoelectron spectroscopy (XPS), and optical transmittance spectrum. The thin films are hexagonal in structure, with strong preferential orientation along the (002) planes. The composition of Cd1-xZnxS thin films monitored by a quartz crystal oscillator agrees well with that obtained from XRF and XPS measurements. The optical constants, such as refractive index, single-oscillator energy, dispersion energy, absorption coefficients, and the optical band gap, were deduced by the Swanepoel's method, in combination with the Wemple and DiDomenico single-oscillator model, from the transmission spectrum of Cd0.8Zn0.2S thin films.关键词
ternary compound/ thin films/ coevaporationKey words
ternary compound/ thin films/ coevaporation引用本文复制引用
Di Xia,Tian Caijuan,Tang Rongzhe,Li Wei,Feng Lianghuan,Zhang Jingquan,Wu Lili,Lei Zhi..Structural and optical properties of Cd0.8Zn0.2S thin films*[J].半导体学报,2011,32(2):11-14,4.基金项目
Project supported by the National Natural Science Foundation of China (No.61076058) and the Science and Technology Program of Sichuan Province,China (No.2008GZ0027). （No.61076058）
