计算机工程2011，Vol.37Issue(4)：281-283,3.DOI:10.3969/j.issn.1000-3428.2011.04.101
基于TSP的低功耗低费用测试方法
Low-power and Low-cost Test Approach Based on TSP
摘要
Abstract
Scan chain disable techniques effectively reduce peak and average test power dissipation. But the test application time is longer. To solve this problem, this paper proposes an approach based on TSP problem to minimize the test application time by exploring the compatibility among the test vectors. Experimental results demonstrate that this approach reduces test application time drastically on various benchmark circuits.关键词
可测性设计/扫描链阻塞技术/无关位填充/确定性测试/低费用测试Key words
design for testability/ scan chain disable technique/ don't care bit filling/ deterministic test/ low-cost test分类
信息技术与安全科学引用本文复制引用
张云,尤志强,邝继顺,彭福慧..基于TSP的低功耗低费用测试方法[J].计算机工程,2011,37(4):281-283,3.基金项目
国家自然科学基金资助项目(60673085,60773207) （60673085,60773207）
教育部留学回国人员科研启动基金资助项目 （）
