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Reset noise reduction through column-level feedback reset in CMOS image sensors*

Li Binqiao Xu Jiangtao Xie Shuang Sun Zhongyan

半导体学报2011,Vol.32Issue(2):137-141,5.
半导体学报2011,Vol.32Issue(2):137-141,5.DOI:10.1088/1674-4926/32/2/025012

Reset noise reduction through column-level feedback reset in CMOS image sensors*

Reset noise reduction through column-level feedback reset in CMOS image sensors*

Li Binqiao 1Xu Jiangtao 1Xie Shuang 1Sun Zhongyan1

作者信息

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摘要

Abstract

A low reset noise CMOS image sensor (CIS) based on column-level feedback reset is proposed. A feedback loop was formed through an amplifier and a switch. A prototype CMOS image sensor was developed with a 0.18 μm CIS process. Through matching the noise bandwidth and the bandwidth of the amplifier, with the falling time period of the reset impulse 6μs, experimental results show the reset noise level can experience up to 25 dB reduction. The proposed CMOS image sensor meets the demand of applications in high speed security surveillance systems, especially in low illumination.

关键词

CMOS image sensor/ reset noise/ feedback reset/ five-transistor pixel/ global shutter

Key words

CMOS image sensor/ reset noise/ feedback reset/ five-transistor pixel/ global shutter

引用本文复制引用

Li Binqiao,Xu Jiangtao,Xie Shuang,Sun Zhongyan..Reset noise reduction through column-level feedback reset in CMOS image sensors*[J].半导体学报,2011,32(2):137-141,5.

基金项目

Project supported by the National Natural Science Foundation of China (Nos.60806010,60976030) and the Research Fund for the Doctoral Program of Higher Education of China (No.200800561111). (Nos.60806010,60976030)

半导体学报

OACSCDCSTPCDEI

1674-4926

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