原子能科学技术2011，Vol.45Issue(4)：461-466,6.
不同偏置下电流反馈运算放大器的电离辐射效应
Ionizing Radiation Effect of Current-Feedback Amplifier Under Different Biases
王义元 1陆妩 2任迪远 3郑玉展 1高博 2陈睿 1费武雄2
作者信息
- 1. 中国科学院新疆理化技术研究所,新疆乌鲁木齐830011
- 2. 新疆电子信息材料与器件重点实验室,新疆乌鲁木齐830011
- 3. 中国科学院研究生院,北京100049
- 折叠
摘要
Abstract
Current-feedback amplifier (CFA) based on the complementary bipolar processes was irradiated by 60 Co γ of low and high dose-rates under different biases. The damage varies with the biases and dose-rates. Irradiated with all pins grounded, the device gets more degradation at low dose rate than that at high dose rate. It exhibits enhanced low dose rate sensitivity (ELDRS). But the degradation is small under low supply voltage, and the difference between low and high dose-rates is not obvious.While under high supply voltage, the damage is severer at high dose rate than low dose rate,and it rebounds after irradiation annealing experiment, which is time-dependent effects. The ELDRS of bipolar device is related to the biases during the irradiation.关键词
电离辐射/电流反馈运算放大器/偏置/低剂量率损伤增强效应Key words
ionizing radiation/ current-feedback amplifier/ bias/ enhanced low dose rate sensitivity分类
信息技术与安全科学引用本文复制引用
王义元,陆妩,任迪远,郑玉展,高博,陈睿,费武雄..不同偏置下电流反馈运算放大器的电离辐射效应[J].原子能科学技术,2011,45(4):461-466,6.
