物理学报2011，Vol.60Issue(1)：543-549,7.
Fe/ZnO(000-1)体系界面相互作用中薄膜厚度效应的光电子能谱研究
Thickness dependence of the interfacial interaction for the Fe/ZnO(000-1)system studied by photoemission
摘要
Abstract
Synchrotron radiation photoemission spectroscopy (SRPES) and conventional X-ray photoelectron spectroscopy (XPS) were used to study the Fe/ZnO (000(1)) interface formation at room temperature. The interaction extent of Fe overlayer during the ZnO substrate was carefully monitored during the increase of Fe coverage, the results showed obvious Fe2+ formation at the initial stage of Fe deposition. Based on the photoemission spectra (PES) changes observed during the deposition of Fe on ZnO up to 3 nm, three meaningful and critical thicknesses have been observed which may be related to the surface charge transport, chemical reaction, and magnetic property, respectively. The new finding may be helpful to the design of related devices based on Fe/ZnO interface.关键词
Fe/ZnO/界面作用/同步辐射光电子能谱/X射线光电子能谱Key words
Fe/ZnO/ interfacial reaction/ synchrotron radiation photoelectron spectroscopy/ X-ray photoelectron spectroscopy引用本文复制引用
张旺,徐法强,王国栋,张文华,李宗木,王立武,陈铁锌..Fe/ZnO(000-1)体系界面相互作用中薄膜厚度效应的光电子能谱研究[J].物理学报,2011,60(1):543-549,7.基金项目
国家自然科学基金(批准号:10775126,10975138)资助的课题. （批准号:10775126,10975138）
