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基于适应度评价扩展自适应遗传算法的门级电路进化设计

柏磊 顾陈 严璐 朱晓华

南京理工大学学报(自然科学版)2011,Vol.35Issue(2):240-244,5.
南京理工大学学报(自然科学版)2011,Vol.35Issue(2):240-244,5.

基于适应度评价扩展自适应遗传算法的门级电路进化设计

Evolutionary Design of Gate-level Circuits Based on Fitness Evaluation Expansion Adaptive Genetic Algorithm

柏磊 1顾陈 1严璐 2朱晓华1

作者信息

  • 1. 南京理工大学电子工程与光电技术学院,江苏南京210094
  • 2. 南京莱斯信息技术股份有限公司智能交通事业部,江苏南京210007
  • 折叠

摘要

Abstract

To solve the problem of losing potential solution in specifying output cells at fitness evaluation stage of genetic algorithm, a new method based on fitness evaluation expansion adaptive genetic algorithm is proposed here.The method takes the output of every single cell in the evolved array as a potential solution, obtaining a best fitness evaluation value.The proposed method enhances the performance of adaptive genetic algorithm due to avoiding the loss of potential solution.Compared with the conventional algorithm in evolutionary design of circuits, the proposed method has advantages of faster convergence, less iteration and higher probability of obtaining desired solution.

关键词

电路进化设计/适应度评价扩展/门级电路/自适应遗传算法/可进化硬件

Key words

evolutionary design of circuits/ fitness evaluation expansion/ gate-level circuits/ adaptive genetic algorithm/ evolvable hardware

分类

信息技术与安全科学

引用本文复制引用

柏磊,顾陈,严璐,朱晓华..基于适应度评价扩展自适应遗传算法的门级电路进化设计[J].南京理工大学学报(自然科学版),2011,35(2):240-244,5.

南京理工大学学报(自然科学版)

OA北大核心CSCDCSTPCD

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