质谱学报2011，Vol.32Issue(2)：86-94,9.
磺隆类除草剂的飞行时间二次离子质谱研究
TOF-SIMS Analysis of Sulfonylurea Herbicides
摘要
Abstract
In order to learn more about the ethyl herbicide residues, we selected six commonly used herbicides as study. These six sulfonylurea herbicides, including bensulfuronmethyl, chlorsulfuron-methyl, pyrazosulfuron-methyl, metsulfuron-methyl, tribenuronmethyl and thifensulfuron-methyl were analyzed by time-of-flight secondary ion mass spectrometry (TOF-SIMS), equipped with gallium gun (69Ga), both their positive and negative ion spectra were obtained clearly. The data show that quasi-molecular ions and recognizable fragment ions are present in the spectra. The main large fragment ions come from cleavage of C-N bond of the group of acid amide in their structure, according to their fragmentation pathways we discussed. The summing-up we discussed mostly based on the stability of chemical bonds and molecular weight of combined fracture fragments. In conclusion, TOFSIMS is expected to qualitatively determine sulfonylurea herbicides as well as their derivatives with high sensitivity and high speed. It can provide a theoretical basis for the analysis of sulfonylurea herbicide and their residues.关键词
磺隆类除草剂/飞行时间二次离子质谱(TOF-SIMS)/裂分规律分类
化学化工引用本文复制引用
陆大荣,梁汉东,王凯旋,盛守祥..磺隆类除草剂的飞行时间二次离子质谱研究[J].质谱学报,2011,32(2):86-94,9.基金项目
国家科技支撑计划(2006BAK03A21)资助 （2006BAK03A21）
