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基于AVR ATmega128的工频耐压试验系统设计

江军 仲崇山 梁亚平 朱庆伟 王一帆 周献飞

现代电子技术2011,Vol.34Issue(12):166-169,175,5.
现代电子技术2011,Vol.34Issue(12):166-169,175,5.

基于AVR ATmega128的工频耐压试验系统设计

Design of Power Frequency Voltage Withstand Test System Based on AVR ATmega128

江军 1仲崇山 1梁亚平 1朱庆伟 1王一帆 1周献飞1

作者信息

  • 1. 中国农业大学,信息与电气工程学院,北京100083
  • 折叠

摘要

Abstract

A design of voltage withstand test system based on LabVIEW and MCU is designed. According to the actual demand of the test process, this system has the functions of data collection, serial communication, virtual interface, parameter real-time detection, relay protection, motor control etc. The hardware of this system adopts modularized structure, including real-time data acquisition module, motor control module, detection and protection module. The software is based on stable AVR Mega128 single-chip microcomputer and full-featured LabVIEW software. MCU and PC organically integrate various hardware modules in the form of serial communication. The development of the system has greatly simplified the experimental process and improved the degree of automation, at the same time,the system has considered the low cost.

关键词

工频耐压/AVR/数据采集/电机控制/检测保护

Key words

power frequency voltage withstand/ AVR/ data collection/ motor control/ detection and protection

分类

信息技术与安全科学

引用本文复制引用

江军,仲崇山,梁亚平,朱庆伟,王一帆,周献飞..基于AVR ATmega128的工频耐压试验系统设计[J].现代电子技术,2011,34(12):166-169,175,5.

基金项目

中国农业大学2009年研究生科研创新专项(15059203) (15059203)

中国农业大学本科生科研训练计划(URP) (URP)

现代电子技术

1004-373X

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