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Material properties and effective work function of reactive sputtered TaN gate electrodes

Zhang Manhong Huo Zongliang Wang Qin Liu Ming

半导体学报2011,Vol.32Issue(5):32-35,4.
半导体学报2011,Vol.32Issue(5):32-35,4.DOI:10.1088/1674-4926/32/5/053005

Material properties and effective work function of reactive sputtered TaN gate electrodes

Material properties and effective work function of reactive sputtered TaN gate electrodes

Zhang Manhong 1Huo Zongliang 1Wang Qin 1Liu Ming1

作者信息

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摘要

关键词

metal gate/thermal stability/effective work function/dipole

Key words

metal gate/thermal stability/effective work function/dipole

引用本文复制引用

Zhang Manhong,Huo Zongliang,Wang Qin,Liu Ming..Material properties and effective work function of reactive sputtered TaN gate electrodes[J].半导体学报,2011,32(5):32-35,4.

基金项目

Project supported by the State Key Development Program for Basic Research of China (No.2010CB934204),the National Natural Science Foundation of China (No.60825403),and the National Key Projects of China (Nos.2009ZX-02302-004,20092X02023-005). (No.2010CB934204)

半导体学报

OACSCDCSTPCDEI

1674-4926

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