半导体学报2011，Vol.32Issue(5)：117-123,7.DOI:10.1088/1674-4926/32/5/055008
A software solution to estimate the SEU-induced soft error rate for systems implemented on SRAM-based FPGAs
A software solution to estimate the SEU-induced soft error rate for systems implemented on SRAM-based FPGAs
摘要
关键词
radiation effect/single-event effect/SRAM-based FPGAs/fault injectionKey words
radiation effect/single-event effect/SRAM-based FPGAs/fault injection引用本文复制引用
Wang Zhongming,Yao Zhibin,Guo Hongxia,L(u) Min..A software solution to estimate the SEU-induced soft error rate for systems implemented on SRAM-based FPGAs[J].半导体学报,2011,32(5):117-123,7.基金项目
Project supported by the National Natural Science Foundation of China (No.10875096). （No.10875096）
