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基于紧缩阈值加速退化试验的长寿命产品可靠性评估

冯静

电子学报2011,Vol.39Issue(6):1253-1256,4.
电子学报2011,Vol.39Issue(6):1253-1256,4.

基于紧缩阈值加速退化试验的长寿命产品可靠性评估

Reliability Assessment for Long-Life Products Based on ADT with Tightened Critical Values

冯静1

作者信息

  • 1. 国防科技大学信息系统与管理学院系统工程系,湖南长沙410073
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摘要

Abstract

For products whose failures are defined in terms of performance characteristics exceeding their critical values,reliability assessment can be based on degradation measurements by using degradation models. Since the time-to-failure depends on the level of critical value,more life data can be obtained by tightening the critical value. This paper presents a method for the estimation of life distribution for long life iroducts by using life data from degradation measurements. The relationship between life and critical value and stress is modeled and used to estimate the life disuibufion at a usual critical value design stress. The model parameters are estimated by using maximum likelihood and least square method. At last, an example is used to illustraate the validity of the method.

关键词

加速退化试验/退化模型/长寿命产品/可靠性评估/紧缩失效阈值

Key words

accelerated degradation tests(ADT)/ degradation model/ long-life products/ reliability assessment/ tightened critical values

分类

信息技术与安全科学

引用本文复制引用

冯静..基于紧缩阈值加速退化试验的长寿命产品可靠性评估[J].电子学报,2011,39(6):1253-1256,4.

基金项目

国家自然科学基金(No.60804054) (No.60804054)

电子学报

OA北大核心CSCDCSTPCD

0372-2112

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