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首页|期刊导航|半导体学报|Exponential dependence of potential barrier height on biased voltages of inorganic/organic static induction transistor

Exponential dependence of potential barrier height on biased voltages of inorganic/organic static induction transistor

Zhang Yong Yang Jianhong Cai Xueyuan Wang Zaixing

半导体学报2010,Vol.31Issue(4):20-24,5.
半导体学报2010,Vol.31Issue(4):20-24,5.DOI:10.1088/1674-4926/31/4/044002

Exponential dependence of potential barrier height on biased voltages of inorganic/organic static induction transistor

Exponential dependence of potential barrier height on biased voltages of inorganic/organic static induction transistor

Zhang Yong 1Yang Jianhong 1Cai Xueyuan 1Wang Zaixing2

作者信息

  • 1. Institute of Microelectronics, School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China
  • 2. School of Electronic and Information Engineering, Lanzhou Jiaotong University, Lanzhou 730070, China
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摘要

关键词

SIT/OSIT/potential barrier height/normalized approach/I-V characteristics

Key words

SIT/OSIT/potential barrier height/normalized approach/I-V characteristics

引用本文复制引用

Zhang Yong,Yang Jianhong,Cai Xueyuan,Wang Zaixing..Exponential dependence of potential barrier height on biased voltages of inorganic/organic static induction transistor[J].半导体学报,2010,31(4):20-24,5.

半导体学报

OA北大核心CSCDCSTPCD

1674-4926

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