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CeO_2缓冲层热处理对Tl-2212薄膜超导特性的影响

谢清连 方兰 阎少林 游峰 黄国华 李建映 左涛 何明 季鲁 张玉婷 赵新杰

人工晶体学报2009,Vol.38Issue(5):1146-1153,8.
人工晶体学报2009,Vol.38Issue(5):1146-1153,8.

CeO_2缓冲层热处理对Tl-2212薄膜超导特性的影响

Effects of Heating Treatments of CeO_2 Buffer Layers on Superconducting Properties of Tl-2212 Films

谢清连 1方兰 2阎少林 3游峰 3黄国华 3李建映 1左涛 1何明 4季鲁 3张玉婷 3赵新杰3

作者信息

  • 1. 广西师范学院物理与电子工程学院,南宁,530001
  • 2. 南开大学信息技术科学学院,天津,300071
  • 3. 南开大学信息技术科学学院,天津300071
  • 4. 中国电子科技集团公司第16研究所,合肥,230043
  • 折叠

摘要

Abstract

The effect of high temperature treatment on the surface morphology,the phase structure of CeO_2 buffer layers grown on sapphire substrates was studied, and also the growth of CeO_2 on Tl-2212 films. The measurements of AFM and XRD showed that annealing of the CeO_2 films produced drastic change in surface morphology and crystalline quality. Annealing treatment at 950 ℃ for 1 h resulted in atomically flat CeO_2 surface and significant improvement of the crystalline quality of CeO_2 films. Experimental results revealed that the superconductivity of Tl-2212 films is closely interconnected with the crystal quality and morphology of buffer layers. The crack-free films with the thickness of 500 nm grown on such buffer layers had a high transition temperature (T_c =107 K), a high critical current density (J_c=3.9 MA/cm~2 at 77 K and zero applied magnetic field) and a low surface resistance (R_s=281 μΩ at 10 GHz and 77 K).

关键词

Tl-2212超导薄膜/缓冲层/AFM

Key words

Tl-2212 superconducting thin film/ buffer layer/ AFM

分类

数理科学

引用本文复制引用

谢清连,方兰,阎少林,游峰,黄国华,李建映,左涛,何明,季鲁,张玉婷,赵新杰..CeO_2缓冲层热处理对Tl-2212薄膜超导特性的影响[J].人工晶体学报,2009,38(5):1146-1153,8.

基金项目

国家重点基础研究发展计划(973)项目(No.2006CB601006) (973)

国家高技术研究发展计划(863)(No.2006AA03Z213) (863)

广西高校优秀人才资助计划项目(No.RC2007024) (No.RC2007024)

人工晶体学报

OA北大核心CSCDCSTPCD

1000-985X

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