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A radiation-hardened SOI-based FPGA

Han Xiaowei Gao Jiantou Wang Jian Li Ming Liu Guizhai Zhang Feng Guo Xufeng Stanley L.Chen Liu Zhongli Yu Fang Zhao Kai Wu Lihua Zhao Yan Li Yan Zhang Qianli Chen Liang Zhang Guoquan Li Jianzhong Yang Bo

半导体学报2011,Vol.32Issue(7):136-141,6.
半导体学报2011,Vol.32Issue(7):136-141,6.DOI:10.1088/1674-4926/32/7/075012

A radiation-hardened SOI-based FPGA

A radiation-hardened SOI-based FPGA

Han Xiaowei 1Gao Jiantou 1Wang Jian 1Li Ming 1Liu Guizhai 1Zhang Feng 1Guo Xufeng 1Stanley L.Chen 1Liu Zhongli 1Yu Fang 1Zhao Kai 1Wu Lihua 1Zhao Yan 1Li Yan 1Zhang Qianli 1Chen Liang 1Zhang Guoquan 1Li Jianzhong 1Yang Bo1

作者信息

  • 1. Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 折叠

摘要

Abstract

A radiation-hardened SRAM-based field programmable gate array VS 1000 is designed and fabricated with a 0.5 μm partial-depletion silicon-on-insulator logic process at the CETC 58th Institute.The new logic cell (LC),with a multi-mode based on 3-input look-up-table (LUT),increases logic density about 12% compared to a traditional 4-input LUT.The logic block (LB),consisting of 2 LCs,can be used in two functional modes:LUT mode and distributed read access memory mode.The hierarchical routing channel block and switch block can significantly improve the flexibility and routability of the routing resource.The VS1000 uses a CQFP208 package and contains 392 reconfigurable LCs,112 reconfigurable user I/Os and IEEE 1149.1 compatible with boundaryscan logic for testing and programming.The function test results indicate that the hardware and software cooperate successfully and the VS 1000 works correctly.Moreover,the radiation test results indicate that the VS 1000 chip has total dose tolerance of 100 krad(Si),a dose rate survivability of 1.5 × 1011 rad(Si)/s and a neutron fluence immunity of 1 × 1014 n/cm2.

关键词

radiation-hardened/FPGA/partial-depletion SOI/reconfigurable LC/routing channel block/switch block

Key words

radiation-hardened/FPGA/partial-depletion SOI/reconfigurable LC/routing channel block/switch block

引用本文复制引用

Han Xiaowei,Gao Jiantou,Wang Jian,Li Ming,Liu Guizhai,Zhang Feng,Guo Xufeng,Stanley L.Chen,Liu Zhongli,Yu Fang,Zhao Kai,Wu Lihua,Zhao Yan,Li Yan,Zhang Qianli,Chen Liang,Zhang Guoquan,Li Jianzhong,Yang Bo..A radiation-hardened SOI-based FPGA[J].半导体学报,2011,32(7):136-141,6.

半导体学报

OACSCDCSTPCDEI

1674-4926

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