现代电子技术2011，Vol.34Issue(13)：179-182,4.
基于IDDT的数字电路故障诊断研究
IDDT Based Diagnosis of Digital Circuit Defects
摘要
Abstract
The resistive-open defects in the digital circuit refers to an imperfect circuit connection of resistors between two circuit nodes that should be connected. A resistive-open defect does not cause a function fault immediately, but it may cause the delay fault, and cannot be detected with the method of voltage: A test method of transient current ( JDdt) for resistive open faults is proposed. It can ensure the location of the fault by means of wavelet analysis.关键词
电阻性开路故障；瞬态电流IDDT；小波分析；数字电路Key words
resistive-open defect/ transient current (Iddt)s wavelet analysis) digital circuit分类
信息技术与安全科学引用本文复制引用
余长庚,赖丽萍..基于IDDT的数字电路故障诊断研究[J].现代电子技术,2011,34(13):179-182,4.
