液晶与显示2011，Vol.26Issue(5)：612-615,4.DOI:10.3788/YJYXS20112605.0612
未确认Mura分析及改善对策
Analysis and Improvement of Unknown Mura
徐伟 1彭毅雯 2肖光辉1
作者信息
- 1. 清华大学电子工程系,北京,100084
- 2. 北京京东方光电科技有限公司,北京,100176
- 折叠
摘要
Abstract
As to the TFT-LCD and other display monitors, Mura is a relatively normal defect which will degrade the display quality greatly. The analysis of the unknown Mura, indicated that the active remain in the Fan-out area are the main reason of the unknown Mura, and a novel method is introduced to solve this defect by changing the condition of Photo process. The mass production feasibility of this method has been demonstrated through experimentation.关键词
未确认Mura/扇形区域/有源层残留/曝光工艺条件Key words
unknown Mura/fan-out area/active remain/exposure condition分类
信息技术与安全科学引用本文复制引用
徐伟,彭毅雯,肖光辉..未确认Mura分析及改善对策[J].液晶与显示,2011,26(5):612-615,4.
