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多通道OLED器件寿命分析测试系统研制

余树福 胡典钢 王坚 彭俊彪

液晶与显示2011,Vol.26Issue(4):532-537,6.
液晶与显示2011,Vol.26Issue(4):532-537,6.DOI:10.3788/YJYXS20112604.0532

多通道OLED器件寿命分析测试系统研制

Multi-Channel OLED Stress Test System

余树福 1胡典钢 1王坚 1彭俊彪1

作者信息

  • 1. 华南理工大学高分子光电材料与器件研究所,特种功能材料教育部重点实验室,广东广州510640
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摘要

Abstract

A multi-channel OLED stress test system was designed and made. The system could simultaneously stress 512 OLED devices independently in constant current, constant voltage, or constant light intensity testing mode. The system has a wide range of testing conditions with output current from 0. 02 mA to 100 rnA, and output voltage from 0 to 24 V. The system adopts a modular design which could easily build 512, 256, 128, 64, 32 channels based on users' needs. The application software built on Lab VIEW development platform includes a user-friendly interface, and a self-protection feature from power failure, ensuring the continuity of the testing, and the safety of the data. With an environment chamber, the ambient temperature and humidity could be conveniently adjusted.

关键词

有机电致发光二极管/寿命/多通道/LabVIEW/老化测试

Key words

OLED/ lifetime/multi-channel/Lab VIEW/stress test

分类

信息技术与安全科学

引用本文复制引用

余树福,胡典钢,王坚,彭俊彪..多通道OLED器件寿命分析测试系统研制[J].液晶与显示,2011,26(4):532-537,6.

基金项目

国家“863”项目(No.20090325,No.2008AA03A311) (No.20090325,No.2008AA03A311)

国家“973”项目(No.2009CB623600) (No.2009CB623600)

国家自然科学基金项目(No.60937001,No.61036007) (No.60937001,No.61036007)

液晶与显示

OA北大核心CSCDCSTPCD

1007-2780

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